Utrecht University

The UU EM facility provides external access to one focused ion beam-scanning electron microscope (FIB-SEM), equipped with varies chemical and crystallographic detectors, three transmission electron microscopes (TEM), equipped with state-of-the-art imaging and chemistry detectors. Moreover, the facility hosts two scanning electron microscopes (SEM), equipped with high-throughput chemical and crystallographic analysis systems and environmental and cryogenic … Continued

X-ray Imaging Facility The X-ray Imaging Facility at Delft University of Technology (TUD) has been instrumental over the past ten years for applied earth science and civil engineering research in the Netherlands using X-ray computed tomography (CT).  TUD offers X-ray imaging and laboratory facilities which allow for 3D imaging from the decimetre- to the micrometre-scale, as well as for … Continued