Utrecht University
The UU EM facility provides external access to one focused ion beam-scanning electron microscope (FIB-SEM), equipped with varies chemical and crystallographic detectors, three transmission electron microscopes (TEM), equipped with state-of-the-art imaging and chemistry detectors. Moreover, the facility hosts two scanning electron microscopes (SEM), equipped with high-throughput chemical and crystallographic analysis systems and environmental and cryogenic … Continued