Helmholtz-Zentrum Potsdam – Deutsches GeoForschungs Zentrum (GFZ)

Scanning Electron Microscopy:

Zeiss: Ultra Plus (FEG-SEM):
The ZEISS Ultra Plus field emission scanning electron microscope allows recording of high-resolution images. The complete detection system of the Ultra Plus combines various detectors: the In-Lens & SE detector for high-resolution images, the In-Lens Energy Selective Backscatter Detector (EsB) & Annular Backscatter Detector (AsB) for an impressive material contrast of each sample, and energy dispersive spectroscopy (EDS) for elemental analysis. We can use the ZEISS Ultra Plus in a variety of scientific areas, including material and geological research. In life sciences, the Ultra Plus allows us to easily analyse samples with high throughput and receive large amounts of data. In addition, the Ultra Plus also offers the possibility of analysing natural biological samples with cryo-attachment and cathodoluminescence (CL) for minerals and material science samples.

Focussed Ion Beam-Scanning Electron microscopy:

Quanta 3D (FEG-FIB-SEM):
A FEI (ThermoFisher Scientific) Quanta 3D FEG is a state-of-the-art Dual Beam device. The SEM column is optimized for high brightness & high-current at acceleration voltage from 200V to 30kV and probe currents from 1pA to 65 pA. Magnifications: x30 – x1.000.000; SE & BSE detectors; Low-vacuum SED (used in low vacuum mode); EDAX TEAM and APEX software for EBSD and EDS. Maximum electron beam resolution – 0.8 nm at 30kV (STEM); Focused Ion Beam Column: Ion source – 1kV to 30 kV. Maximum ion beam resolution – 7 nm at 30kV. Omniprobe nanomanipulator. In situ Pt and C gas injection systems.

Helios G4 Dual Beam (FIB-SEM):
The ThermoFisher Scientific Helios G4 Dual Beam Helios G4 UC delivers a resolution of 0.6 nm at 30 kV STEM, 0.7 nm at 1 kV, 1.0 nm at 500V (ICD). Electron beam current range: 0.8 pA to 100 nA, accelerating voltage range: 200 V to 30 kV. Maximum horizontal field width: 2.3 mm at 4 mm WD. Ion beam current range: 0.1 pA to 65 nA, accelerating Voltage range: 500 V to 30 kV. Elstar inlens SE/BSE detector; Everhart-Thornley SE detector (ETD); Retractable STEM3+ detector with BF/DF/HAADF segments; Gas Injection System; Easylift for precise in situ sample manipulation; AutoTEM wizard automated sample preparation.

Transmission Electron Microscopy:

Tencai F20 G2 X-Twin (FEG-TEM):
The FEI (ThermoFisher Scientific) Tecnai G2 F20 X-Twin (200 kV) delivers a spatial resolution of < 0.3 nm at 200 kV; FEG electron source; HAADF Detector; Gatan Tridiem (EELS, EFTEM); EDAX energy dispersive X-ray spectroscopy system; TEM sample holders: Gatan double-tilt holder; Single-tilt tomography holder; low background double-tilt holder; Single-tilt rotation holder; Gatan double-tilt liquid nitrogen holder; Gatan heating holder.

Themis Z (FEG-STEM):
ThermoFisher Scientific Themis Z (3.1); Cs S-CORR Probe Corrector (80-300 kV) (space resolution is < 0.06 nm at 300 kV); XFEG electron source with a monochromator (energy resolution is < 0.3 eV); HAADF, DF2, DF4 and BF Detectors; STEM Imaging of light elements; SuperX energy dispersive X-ray spectroscopy system; Gatan Imaging Filter Continuum ER/1065 (EELS, EFTEM); Low-dose Exposure Technique; Precession electron diffraction.

Nano-scale characterisation of Earth materials:
We have strong expertise in the preparation of both inorganic and hybrid bio-geo materials for micrometer-sized specimens. We offer spatially resolved sectioning via FIB-SEM nanomanipulation and or ion milling. We also can prepare slices of both inorganic and hybrid samples using an ultramicrotome operated at room temperature or in cryo mode. Staining and embedding for biological samples is also possible. Through these approaches, various samples covering a large breadth of research interests can be prepared for subsequent investigation with SEM or TEM.