Utrecht University

The UU EM facility provides external access to one focused ion beam-scanning electron microscope (FIB-SEM), equipped with varies chemical and crystallographic detectors, three transmission electron microscopes (TEM), equipped with state-of-the-art imaging and chemistry detectors. Moreover, the facility hosts two scanning electron microscopes (SEM), equipped with high-throughput chemical and crystallographic analysis systems and environmental and cryogenic imaging capabilities. As polarised thin sections microscopy is the first diagnostic steps in earth material investigations, UU also provides an automated optical scanning system with a giga- pixel resolution and full polarization-rotation capabilities that directly interfaces into EM sample navigations. For on-site image processing, UU provides three multi-core workstations.

Together, these instruments provide all necessities for the multi-scale analysis of earth materials. 

UU has extensive electron microscopy and laboratory facilities which allow for sample preparation, chemical and crystallographic analysis at micrometre- to nanometre-scale. This includes SEMs with automated mineralogy and electron backscatter diffraction (EBSD), an electron microprobe (EMP), several FIB-SEMs and analytical TEMs. The Department of Earth Science which is a member of UU EM has an advanced infrastructure and expertise in nanogeosciences, mineralogy, petrology, rock deformation as well as ample knowledge in running European projects and large-scale infrastructures. 

Sustainable travel policy

Utrecht University wants to be CO₂ neutral by 2030. This also means making travel behaviour more sustainable. UU employees are motivated to take the train instead of a plane when traveling within 700 km’s and under 8 hours. We highly recommend visitors to our facilities to make similar smart choices.